urrently there are two electron microscopes in the LAEM Laboratory. All necessary machines/equipment for sample preparation were recently funded by the office of Vice Presidend for Research of WSU.
1. JEOL-2010 FasTEM Transmission Electron Microscope (TEM)
The TEM (Funded by National Science Foundation) is equipped with Energy Dispersive X-Ray Spectrometry (EDS), double-tilt sample holder, single-tilt sample holder, hot stage (up to 1000 °C), cold stage (cooled by liquid nitrogen) and precise temperature control systems.
Maximum operating high voltage: 200 kV
Point resolution: 0.23 nm
Lattice resolution: 0.14 nm
Spherical aberration: 1.0 mm
Maximum magnification: 1.5 million times
Functions: Imaging both diffraction contrast and phase contrast (Lattice image); diffraction, including convergent-beam diffraction (CBED) and nano-diffraction; local chemical composition analysis; observations on microstructure evolution at different temperature (from liquid nitrogen temperature to 1000 °C), etc.
2. Hitachi S-2400 Scanning Electron Microscope (SEM)
The SEM is equipped with Dispersive X-Ray Spectrometry (EDS), Robinson Backscattered Electron (BSE) Detector, Detector of Electron Backscattered Diffraction (EBSD)/Orientation Imaging Microscope (OIM).
- Maximum operating high voltage: 25kV
- Resolution: 4nm
- Maximum Magnification: 300,000x
Functions:
- Secondary electron imaging (Best Resolution: 4nm)
- Backscattering imaging: reveal composition contrast & electron channeling
- EBSD/OIM/ (Oxford HKL): detect crystal orientations of grains in materials; measure texture existing in materials; mapping with orientation distributions
- EDS (EDAX/TSL): detect chemical compositions at different locations in materials; elemental composition distribution mapping
3. Software assisting TEM analysis
Software name: "jems" (java edition) developed by Professor P. Stadelmann, CIME, EPFL, Switzerland.
Functions:
- Build crystal file according to crystal structure (crystal system, point group space group), show crystal structure and atom arrangement on computer screen along different orientation;
- Index and simulate diffraction pattern, including convergent-beam electron diffraction patterns, Kikuchi patterns, powder diffraction patterns;
- Calculate phase transfer function;
- Simulate high resolution (lattice) image.
4. Gatan 691 Precision Ion Polishing System (PIPs)
This machine is equipped with low temperature trap to minimum the possible heating during ion beam milling process.
Functions: Final thinning process of the TEM samples.
5. Dimpling Grinder (Fischione Model 200)
This machine reduces the thickness around the center area of the 3mm disc for final thinning by PIPs. Sometimes it can be used to thin the sample directly to transparence for TEM observations. This machine is very important when cross-section TEM sample of thin films, multilayer, superlattice samples, or when very delicate TEM samples are prepared.
Function: Reduce the thickness of the central area of 3mm disc by dimpling.
6. Ultrasonic Cutter (Fischione Model 170)
This machine cuts 3 mm diameter disc from materials, especially from wafers, ceramics
Function: Cut 3 mm disc.
7. Twin-Jet Electro-polisher (Fischione Model 110)
This machine performs final thinning of TEM sample to transparence by electro-polishing method. It is equipped with low temperature cooling container, which enables thinning being finished at low temperature.
Function: Final thinning of TEM sample. It is suitable for metals and alloys.
8. Polisher/Grinder (Buehler ECOMET 3000):
Function: Intermediate polishing on the sample.
9. Carbon Coater (Cooke CVE-301)
Function: To coat carbon film on non-conductive sample for SEM/TEM observations.
10. Gold Sputter (EffaCoater)
Function: To coat gold film on non-conductive sample for SEM/TEM observations.
11. Low Speed Diamon Saw. (Allied High Tech - Tech Cut 4)
Function: To cut sample slice.
Signup for usage of the SEM and/or TEM is via. the CIF Resource Management System. External samples or instrument usage is possible (University, External, Corporate). Contact CIF Director, Dr. David M. Coleman for information, fee structure, etc.
